Next Generation Test Cell
In a primitive form of Final Test, a test cell is composed of a handler, a tester and a tester workstation that communicates with the handler over a GPIB, parallel or serial communications interface. Within this test cell, an operator divides his time between multiple testers, performing many tasks and, when or if time allows, checks whether any testers are running out-of-control.
In contrast, JCET has evolved to a Next Generation Test Cell that includes an Automatic Test Cell Controller and a Tester Utilization Tracking System connected to the communications interface between tester
and handler that monitors all the activity between tester and handler (see photo below).
Real-Time Monitoring and Control
The Tester Utilization Tracking System automatically captures the actual, real-time tester utilization where productive time is actual test time + actual index time and all other time is a category of waste. Utilization trends are displayed on a utilization monitor next to the tester workstation.
At the same time, the Automatic Test Cell Controller is continuously monitoring the good yield, the yield variation between test sites and the failure rates for all hard and soft bins looking for pre-defined out-of-control events. When it detects an out-of-control event, the Auto Controller automatically stops the tester and activates an alarm to immediately bring line support technicians into the test cell to fix the problem.
This Next Generation Test Cell also includes a scanner to avoid manual entry mistakes. Test hardware used in production at JCET is bar-coded along with the Lot ID on the Lot Traveler.
Automatic Closed Loop Process Control
This Next Generation Test Cell enables automatic closed loop process control, which JCET utilizes to keep test manufacturing processes under control at all times.
Handler Equipment
At the core of a Final Test cell is a test platform and a handler. The following table highlights the primary handling equipment used for Final Test atJCET.
|
Temperature Capability |
Range |
Handler Manufacturers |
Models |
Pick and Place |
Ambient to Hot |
|
Seiko Epson |
Northstar series |
|
Ambient to Hot |
|
Synax |
SX series |
|
Ambient to Hot |
|
Delta Design |
Delta EDGE |
|
Ambient to Hot |
|
Hontech |
HT9045W |
|
Tri-Temp |
|
Multitest |
MT 9510 |
|
Tri-Temp |
-60 oC to 160 oC |
Delta Design |
Delta Castle |
|
Tri-Temp |
|
Synax |
SX141C |
Gravity Feed |
Ambient to Hot |
|
Multitest |
MT8, MT9 series |
|
Ambient to Hot |
|
MCT |
3608 |
|
Ambient to Hot |
|
Symtek |
300 series |
|
Tri-Temp |
|
Multitest |
MT8, MT9 series |
|
Tri-Temp |
-60 oC to 160 oC |
Rasco |
SO series |
|
Tri-Temp |
|
Aseco |
S series |
Turret |
Ambient |
|
SRM |
XD series |
High Parallel Memory Test |
Tri-Temp |
|
Mirae |
M440 |
High Parallel Strip Test |
Ambient |
|
TESEC |
3270-IHR |
System Level Test |
Ambient to Hot |
25 oC to 125 oC |
Chroma |
3620* |
|
|
|
Hontech |
3000 |
Other types of handling equipment are available at JCET factories to satisfy special customer requests. Contact JCET to request other handlers not highlighted in the table.
Small Package Handling
For package body sizes less than 3×3 mm, JCET recommends either a turret handling solution or a strip test solution. JCET’s turret handlers integrate tape and reel creating a continuous manufacturing flow from Final Test into Post Test to improve throughput.
Burn-In Services
JCET offers sophisticated Burn-In systems with deep vector memory for dynamic Burn-In. Vector memory enables high fault coverage during the Burn-In process. JTAG testing and boundary scan can also be performed during Burn-In.
JCET has established close working relationships with subcontractors whose core business is Burn-In. By extending its Burn-In capabilities to include outside Burn-In specialists, JCET can take advantage of proprietary technology, techniques and Burn-In patterns from these vendors to satisfy any special customer requirements.
JCET also provides services for design and development of Burn-In boards and vector memory patterns for dynamic Burn-In.