Test Development Services
Test Development Services

JCET provides customers with test development and test program migration services.  Our capabilities include:

? Design for Manufacturing (DFM) consultation
? Test program development, debug and validation
? Device characterization
? First silicon characterization (wafer test)
? Test program optimization including test time optimization
? Probe card design, fabrication and qualification (wafer test)
? Load board design, fabrication and qualification (final test)
? Design, fabrication and qualification of any other interfacing hardware (final test)
? Multi-site migration to higher parallel testing
? Test program migration to a different test platform

Included with these services are any test program changes required to rapidly maximize and stabilize first pass yields for high volume production.

Test Development Flow

聯系我們 |  客戶查詢 |  法律聲明

聯系我們 客戶查詢 法律聲明

版權所有@江蘇長電科技股份有限公司 保留一切權利 蘇ICP備05082751號32028102000607

蘇ICP備05082751號 32028102000607